Both scan ATPG and IJTAG patterns are used to test a piece of logic that is part of a much larger SoC design. For both, the patterns are independent of the logic in the actual design. Both patterns ...

A common, but mostly unconscious habit of software developers when theyface a problem is to break it down into its constituent elements, lookfor patterns of behavior and activity, and compare them to ...

Integrating pattern matching with DFM operations ensures designs are quickly and accurately optimized for reliability, performance, and manufacturing prior to tapeout. Pattern matching is best known ...