ATC 2.0 Option Enables Dynamic Multisite Sensing and Regulation of Device Temperature for Optimized Test of High-End Automotive SoCs TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test ...
Cupertino, Calif.—Verigy has introduced the V5000ep, which allows customers to perform quality assurance, characterization and small lot production at wafer sort and final test on new memory devices.
Custom designed system applies Industry 4.0 concepts to minimize downtime and cost of ownership while improving automation, quality, and yield in semiconductor testing operations Combines advanced ...
Tokyo—Advantest Corp. has announced its M6242 dynamic test handler that provides throughput of 42,200 units per hour for high-volume production test of memory devices such as DRAM. The M6242 supports ...
The Multitest MT2168 pick-and-place handler now offers the ability to characterize devices at cold conditions. This capability addresses the evolving requirements for temperature performance driven by ...
TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced a new Active Thermal Control (ATC) option for its M4841 ...
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