Episode 6 | While You Are Searching for Defects, the Defects Keep Increasing—A Story About Changing Electrostatic Discharge Management

While you are searching for defects, the defects keep increasingOne of the most troublesome things when a defect occurs on ...
Semiconductor Engineering

Finding Critical Defects Before They Become Costly Failures: Process Control For Hybrid Bonding And Advanced Packaging

In advanced packaging, value accumulates layer by layer, component by component, and process step by process step. By the time chiplets, high-bandwidth memory stacks, or hybrid-bonded devices reach ...
techtarget

Defect tracking: Lean principles for getting the right data at the right time

Some people argue that defects must be tracked throughout the lifecycle in order to have high quality software. Others argue against tracking defects early for a variety of reasons. To determine the ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.